Electron microscopy innovative technologies
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EDS Chemical Analysis Services | SEM Elemental Analysis

Microscopic elemental maps showing calcium, arsenic, and lead distribution in a sample.

EDS Mapping

EDS is a powerful chemical analysis technique that allows for the measurement of the local composition of a material. This technique collects the characteristic x-rays generated when the electron beam strikes the sample. These x-rays can be measured to quantify the chemicals present. Furthermore, EDS mapping can be achieved by collecting an EDS spectrum at each point, displaying each pixel intensity as a function of the composition. For those interested in exploring these advanced capabilities, electron microscope rentals provide an excellent opportunity to utilize this sophisticated analysis.

Microscopic image showing two distinct phases highlighted in blue and red.

Phase Mapping

Our software leverages advanced chemical analysis techniques to analyze the EDS spectrum acquired at each point in a map, identifying statistically significant phases present. Utilizing Principal Component Analysis (PCA), this method compares the shape of the EDS spectrum at each location. The software can also calculate the area fraction of each identified phase, along with its average composition, and produce a phase map that illustrates the distribution of the phase. For those interested, we also offer electron microscope rentals to facilitate EDS mapping.

SEM image shows circular patterns with elemental weight percent graph below.

EDS Linescans

EDS mapping can also be utilized to create a chemical line profile, allowing for the measurement of how the elemental distribution in a sample changes across an interface. In the example on the left, a line scan with 50 points was collected across an interface of interest. The linescan clearly illustrates increasing levels of lead (Pb) and arsenic (As) in the brighter contrast region of the glass sample being analyzed, demonstrating one of the effective chemical analysis techniques available. For those interested in conducting such analyses, electron microscope rentals can provide access to the necessary equipment.

SEM image with EDS spectrum showing elemental peaks of Si, O, Na, Al, K, and Ca.

Semi-Quantitative Analysis

An EDS x-ray spectrum can be collected, and using advanced algorithms such as ZAF and PhiRhoZ, a semi-quantitative result can be calculated for each element present. This method is particularly effective for heavier elements like transition metals. While EDS mapping can identify light elements such as Carbon, Oxygen, and Nitrogen, the errors in measurement for these lighter elements can be significant. For those interested in detailed chemical analysis techniques, electron microscope rentals can provide access to high-quality EDS capabilities.


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  • Home
  • Phenom SEM Rentals
  • EDS Chemical Analysis
  • SEM Imaging
  • EBSD Grain Mapping
  • Upcoming Workshops
  • Axia ChemiSEM
  • Phenom XL
  • About Us
  • Gallery
  • Contact Us

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